Y. Miyazaki, M. Hattori and S. Komatsu: Numerical Analysis of the Near-Field Scanning Optical Microscope by the Boundary Element Method: Analysis of the imaging property with a self consistent solution, Jpn. J Opt. (KOGAKU), Vol. 28 (1999) 278-281.

The electro-magnetic field including evanescent wave arising in the neighborhood of the probe of the near-field optical microscope is calculated using the boundary element method. Self consistent analysis of the sample-probe interaction is shown. Furthermore, the image of the planar surfaced dielectric sample is analyzed, and its contrast inversion is observed as the relative index ratio of the sample is inverted.